- integrated equipment test
- 1) Техника: комплексное исследование оборудования (быстрых ядерных реакторов)2) Макаров: (IET) комплексное исследование оборудования (быстрых ядерных реакторов)
Универсальный англо-русский словарь. Академик.ру. 2011.
integrated equipment test
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Integrated Logistics Support — (ILS) is a technique introduced by the US Army to ensure that the supportability of an equipment is considered during its design and development. The technique was adopted by the UK MOD in 1993 and made compulsory for the procurement of the… … Wikipedia
Integrated circuit — Silicon chip redirects here. For the electronics magazine, see Silicon Chip. Integrated circuit from an EPROM memory microchip showing the memory blocks, the supporting circuitry and the fine silver wires which connect the integrated circuit die… … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… … Wikipedia
Integrated Truss Structure — ISS elements as of February 2010[update] … Wikipedia
Equipment of the Indian Army — This is a list of some of the modern historical equipment used by Indian Army. Most of the army equipment is imported, but efforts are being made to manufacture indigenous equipment. About 40 Ordnance Factories under control of Ordnance Factory… … Wikipedia
Military equipment of Turkey — The military equipment of Turkey includes a wide array of arms, artilleries, large surface vessels, cannons, armored vehicles, mortars, unmanned vehicles and many different equipments. Contents 1 Historical development 1.1 General 1.2 1923 1950 … Wikipedia
Automatic test equipment — Automatic/automated test equipment (ATE) is any automated device that is used to quickly test printed circuit boards, integrated circuits, or any other related electronic components or modules. Nowadays, ATE devices are essentially always… … Wikipedia
Built-in self-test — A built in self test (BIST)mechanism within an integrated circuit (IC) is a function that verifies all or a portion of the internal functionality of the IC. For example, a BIST mechanism is provided in advanced fieldbus systems to verify… … Wikipedia
Heavy equipment (construction) — Heavy machinery redirects here. For the album by Anders Johansson, Jens Johansson and Allan Holdsworth, see Heavy Machinery (album). Heavy equipment vehicles of various types parking near a highway construction site … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
